The ICMIE conference is the premier interdisciplinary platform for the presentation of new advances and research results in the fields of Measurement Instrumentation and Electronics. The conference will bring together leading academic scientists, researchers and scholars in the domain of interest from around the world.

Topics of interest for submission include, but are not limited to:

Topics | Flyer

I. Instrumentation and Measurement Systems

  • Electronic instruments and measurement systems
    Optical instruments and measurement systems
    MEMS instruments and test systems
    Precision instruments and measurement systems
    Scientific experiment and analytic instruments
    Testability and built-in-test
    Virtual instruments
    VLSI testing and fault diagnosis

    II. Data Acquisition and Analysis

  • Cyber-physical systems
    Data acquisition systems and technology
    Image processing
    Internet of Things (IoT)
    Machine learning and pattern recognition
    Massive data management and analysis
    Measurement error theory
    Measurement systems and theory
    Networks in test and measurement
    Non-electric measurement
    Reconfigurable computing and sensor fusion
    Sensor networks
    Sensors and transducers
    Signal analysis and processing
    Signal transmission and data bus
    Virtual measurement

    III. Electronics and Applications

  • Biomedical electronics
    Communication theory and systems
    Control theory and applications
    Electrical machines and drives
    Electrical materials and electromagnetics
    Electronics instrumentation
    High voltage techniques and microwave
    Intelligent systems and sensors
    Multi-robot systems
    Power electronics and applications
    Robotics and automation systems