Call for papers

Submissions will be peer reviewed and evaluated based on originality, relevance to conference, contributions, and presentation. All accepted (Registered & Presented) papers of ICMIE 2017 will be collected in the conference proceedings as a volume of Journal of Physics: Conference Series (JPCS).  The indexing information of JPCS:
Conference Proceedings Citation Index
– Science (CPCI-S) (Thomson Reuters, Web of Science), Ei Compendex, Scopus, Inspec, Chemical Abstracts Service, INIS (International Nuclear Information System), NASA Astrophysics Data System, SPIRES, VINITI Abstracts Journal (Referativnyi Zhurnal)

The topics of ICMIE include:

Measurement, Instruments & Test 

Virtual Instrument
Scientific Experiment and Analytic Instrument

Educational Instrument & Experimental System

Microprocessor and Embedded System

VLSI Testing and Fault Diagnosis

MEMS Instruments and Test System

Testability and Built-in-test

Electronic Instrument & Measurement System

Optical Instrument & Measurement System

Precision Instruments & Measurement System

Instrument & Measurement in Research & Engineering

Simulation and Experimental Technology

Physical, Chemical and Biological Field

Material & Electro-mechanical Engineering

Energy and Power Engineering

Communication Technology

Aerospace & Avionics & Navigation

Automobile Engineering

Environmental Engineering

Biomedical Instrument and Application

Safety Monitoring Instruments and Systems


Measurement & Test Information Processing

Measurement System and Theory

Measurement Error Theory

Virtual Measurement

Machine Learning and Pattern Recognition

Massive Data Management and Analysis

Reconfigurable Computing
Sensors Fusion

Signal Analysis and Processing

Image Processing


Measurement & Test Information Acquisition and Transmission

Sensors and Transducers

Non-electric Measurement

Sensor Network

Data Acquisition System and Technology

Signal Transmission and Data Bus

Networks in Test and Measurement

IOT: Internet of Things

Cyber Physical System